DD Form 1697-1 Circuit Parameter Test Data - Digital

DD Form 1697-1 - also known as the "Circuit Parameter Test Data - Digital" - is a Military form issued and used by the United States Department of Defense.

The form - often incorrectly referred to as the DA form 1697-1 - was last revised on December 1, 2002. Download an up-to-date fillable DD Form 1697-1 down below in PDF-format or find it on the Department of Defense documentation website.

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CIRCUIT PARAMETER TEST DATA - DIGITAL
1. CCSD
2. TYPE TEST
3. START TIME (DTG)
4. END TIME (DTG)
5. PARAMETER CODE
6. DATA RATE
7. TYPE INTERFACE
8. TYPE SYNC/CLOCK SOURCE
9. TYPE SIGNAL/CODING
10. TEST PATTERN
11. BLOCK SIZE
12. LOCAL STATION TEST ADMINISTRATOR
13. DISTANT END TEST ADMINISTRATOR
TEST SPECIFICATIONS
TEST RESULTS
TYPE
SPECIFICATION
TYPE
LOCAL
DISTANT END
Total Errors
14. BIT ERROR RATE
1 X 10 -
Error Rate
Errored Seconds
%
15. % ERROR FREE SECONDS
% EFS
SES
16. SEVERELY ERRORED SECONDS (SES) %
%
% SES
Degraded Minutes
17. % DEGRADED MINUTES
%
% Degraded Minutes
Total Errors
18. RESIDUAL BER
1 X 10 -
Error Rate
Unavailable Seconds
19. AVAILABILITY
%
% Unavailable Seconds
Pattern/Data Loss
20. LOSS OF BIT COUNT INTEGRITY (LBCI)
<
Clock Loss
Delay
milli-
21. DELAY
seconds:
Pattern Slips
22. TIMING ERRORS
<
Clock Slips
Total BPV
23. BI-POLAR VIOLATIONS (BPV)
<
Average BPV Rate
Total Frame Errors
24. FRAME ERRORS
<
Frame Error Rate
Total CRC Errors
25. CYCLIC REDUNDANCY CHECK (CRC)
<
ERRORS
Average CRC
Total Parity Errors
26. PARITY ERRORS
Average Parity Errors
27. REMARKS
PASS
FAIL
28. SIGNATURE OF TEST ADMINISTRATOR
PERFORM ALL TESTS SIMULTANEOUSLY
WHENEVER POSSIBLE.
DD FORM 1697-1, DEC 2002
PREVIOUS EDITION IS OBSOLETE.
Adobe Professional 7.0
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CIRCUIT PARAMETER TEST DATA - DIGITAL
1. CCSD
2. TYPE TEST
3. START TIME (DTG)
4. END TIME (DTG)
5. PARAMETER CODE
6. DATA RATE
7. TYPE INTERFACE
8. TYPE SYNC/CLOCK SOURCE
9. TYPE SIGNAL/CODING
10. TEST PATTERN
11. BLOCK SIZE
12. LOCAL STATION TEST ADMINISTRATOR
13. DISTANT END TEST ADMINISTRATOR
TEST SPECIFICATIONS
TEST RESULTS
TYPE
SPECIFICATION
TYPE
LOCAL
DISTANT END
Total Errors
14. BIT ERROR RATE
1 X 10 -
Error Rate
Errored Seconds
%
15. % ERROR FREE SECONDS
% EFS
SES
16. SEVERELY ERRORED SECONDS (SES) %
%
% SES
Degraded Minutes
17. % DEGRADED MINUTES
%
% Degraded Minutes
Total Errors
18. RESIDUAL BER
1 X 10 -
Error Rate
Unavailable Seconds
19. AVAILABILITY
%
% Unavailable Seconds
Pattern/Data Loss
20. LOSS OF BIT COUNT INTEGRITY (LBCI)
<
Clock Loss
Delay
milli-
21. DELAY
seconds:
Pattern Slips
22. TIMING ERRORS
<
Clock Slips
Total BPV
23. BI-POLAR VIOLATIONS (BPV)
<
Average BPV Rate
Total Frame Errors
24. FRAME ERRORS
<
Frame Error Rate
Total CRC Errors
25. CYCLIC REDUNDANCY CHECK (CRC)
<
ERRORS
Average CRC
Total Parity Errors
26. PARITY ERRORS
Average Parity Errors
27. REMARKS
PASS
FAIL
28. SIGNATURE OF TEST ADMINISTRATOR
PERFORM ALL TESTS SIMULTANEOUSLY
WHENEVER POSSIBLE.
DD FORM 1697-1, DEC 2002
PREVIOUS EDITION IS OBSOLETE.
Adobe Professional 7.0
Reset
INSTRUCTIONS FOR COMPLETING DD FORM 1697-1,
CIRCUIT PARAMETER TEST DATA - DIGITAL
Item 1 - Enter the Command Communication Service Designator (CCSD) of the link, trunk, or circuit being
tested. (NOTE: for the rest of the instructions, the term "circuit" will be used generically to refer to either
the link, trunk, or circuit being tested.)
Item 2. Enter the type of test being performed: Initial Test and Acceptance or Out-of-Service QC.
Item 3 - Enter the date and time the test began.
Item 4 - Enter the date and time the test was completed.
Item 5 - Enter the parameter code of the circuit under test (found in the TSO item 2.(f)).
Item 6 - Enter the data rate of the circuit under test (found in the TSO item 2.(I)).
Item 7 - Enter the type of interface used to connect the test set to the circuit being tested.
Item 8 - Enter the type of synchronization used on the test set and the source of the clock timing.
Item 9 - Enter the type of signal (NRZ, AMI, etc.) and coding (D4, ESF, etc.) of the circuit under test.
Item 10 - Enter the type of test pattern used (configured on the test set).
Item 11 - Enter the size of the data block the test set is configured for.
Item 12 - Enter the name of the test administrator at the local facility.
Item 13 - Enter the name of the test administrator at the distant end facility.
Items 14 - 26:
Under the Test Specification column, insert the specification identified in DISAC 300-175-9, Chapter 3,
which corresponds to the parameter code of the circuit under test.
Under the Test Results, Local column, record the results acquired by the test set for each type of test
result by the local facility.
Under the Distant End column, record the results acquired by the test set for each type of test result by
the distant end facility.
Item 27 - Enter any amplifying remarks pertinent to the test. Compare the test specifications with the results
to determine if the test passed or failed. Mark the appropriate box.
Item 28 - Enter the signature of test administrator or supervisor.
DD FORM 1697-1, DEC 2002

Download DD Form 1697-1 Circuit Parameter Test Data - Digital

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